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Additive Manufacturing: Changing the Production Landscape

Explore this Inconel Lattice, produced by additive manufacturing and scanned non-destructively in 3D with ZEISS X-ray Microscopy

As mentioned in the above video, this dataset is a 3D printed Lattice of Inconel high temperature nickel-based superalloy. The sample was scanned non-destructively in 3D using X-ray Microscopy with the ZEISS Xradia Versa. The Scout & Zoom workflow was used to capture data across length scales - from the whole sample overview to the highest resolution scan where it is possible to visualise minute details, such as satellite particles.

3D deep-dive into the sample with X-ray Microscopy

Sample courtesy of Kavan Hazeli, Mechanical and Aerospace Engineering, The University of Alabama, Huntsville.
Figure 1
Figure 1

Figure 1 shows the sample overview, scanned with the 0.4x objective. The whole sample is visible with relatively low resolution and voxel size (3D pixel) of 8 microns. At these resolutions only the largest partially fused particles and surface textures are visible.Lorem ipsum dolor sit amet, consetetur sadipscing elitr, sed diam nonumy eirmod tempor invidunt ut labore et dolore magna aliquyam erat, sed diam voluptua. At vero eos et accusam et justo duo dolores et ea rebum. Stet clita kasd gubergren, no sea takimata sanctus est Lorem ipsum dolor sit amet.

Figure 2
Figure 2

In Figure 2, a higher resolution scan of the lattice is seen correlated to the overview scan. The 4x objective of the Xradia Versa has been used for the smaller dataset, giving a higher resolution image at the expense of field of view.Lorem ipsum dolor sit amet, consetetur sadipscing elitr, sed diam nonumy eirmod tempor invidunt ut labore et dolore magna aliquyam erat, sed diam voluptua. At vero eos et accusam et justo duo dolores et ea rebum. Stet clita kasd gubergren, no sea takimata sanctus est Lorem ipsum dolor sit amet.

Figure 3
Figure 3

Finally, Figures 3 and 4 show the highest resolution scan, captured with a voxel size of 3.5 microns, making the smaller satellite particles and surface structures more clearly visible. This higher detail allows a more accurate quantification of the satellite particles, as seen in Figure 3. The higher resolution scan also shows more definition in the internal porosity of the lattice, shown clearly in Figure 4.Lorem ipsum dolor sit amet, consetetur sadipscing elitr, sed diam nonumy eirmod tempor invidunt ut labore et dolore magna aliquyam erat, sed diam voluptua. At vero eos et accusam et justo duo dolores et ea rebum. Stet clita kasd gubergren, no sea takimata sanctus est Lorem ipsum dolor sit amet.

Scanning Technology

High Resolution 3D X-ray Microscopy
  • Characterize the properties and behaviours of your materials non-destructively.
  • Reveal details of microstructures in three dimensions (3D).
  • Develop and confirm models or visualize structural details.
  • Achieve high contrast and submicron resolution imaging even for relatively large samples.

Xradia 610 & 620 Versa

3D X-ray Microscopy for Faster Sub-Micron Imaging of Intact Samples

Expand the boundaries of your non-destructive sub-micron scale imaging built on industry-best resolution and contrast.

3D in 3 Minutes

See the scanning technology in action

On-Demand Webinars

Microscopy in Additive Manufacturing: A Focus on Powder...

Webinar Apr 14, 2020

Dr. Hrishikesh Bale, Solutions Manager, Engineering Materials, ZEISS.

Opportunities in 3D and 4D Imaging with Laboratory X-ray Microscopy

Webinar Apr 27, 2020

Dr. Nicolas Gueninchault, X-Ray Microscopy Systems Product Application and..

In Situ and 4D Characterization Across Length Scales in Materials...

Webinar May 6, 2020

Dr. Hrishikesh Bale, ZEISS Microscopy and Dr. Nikhilesh Chawla Fulton,..

Downloads

  • Preview image of ZEISS Xradia 610 and 620 Versa

    ZEISS Xradia 610 and 620 Versa

    Your 3D X-ray Microscopes for Faster Sub-Micron Imaging of Intact Samples
    Pages: 41
    File size: 11 MB
    Download

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