Easily create comprehensive statistics
Whether you need to provide information about the quality of your measurement results or your production process: ZEISS PiWeb supports you with any kind of statistics that help tracking your production quality.
GR&R Studies
Perform GR&R Studies Type I, II & III ARM and ANOVA with tactile, optical or manual measurement data.
![]({"small":"https://images.zeiss.com/metrology/products/software/piweb/piweb_powerful-statistics.ts-1674047876732.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=044b5dad978c8b90f3e0c7be148c6444","large":"https://images.zeiss.com/metrology/products/software/piweb/piweb_powerful-statistics.ts-1674047876732.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=e50eedb9b524bdbeb547361721b58aac","medium":"https://images.zeiss.com/metrology/products/software/piweb/piweb_powerful-statistics.ts-1674047876732.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=2adceda3fd3b36818196c21eca715f7a","full":"https://images.zeiss.com/metrology/products/software/piweb/piweb_powerful-statistics.ts-1674047876732.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=d8374559106cbd9971e422b2f939ed41"})
![]({"small":"https://images.zeiss.com/metrology/products/software/piweb/piweb_control-chart.ts-1673610398398.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=34825bdc319ed0013b5dc2532a7e0cb8","large":"https://images.zeiss.com/metrology/products/software/piweb/piweb_control-chart.ts-1673610398398.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=7d59de5e5e7606343184e2dba02afa61","medium":"https://images.zeiss.com/metrology/products/software/piweb/piweb_control-chart.ts-1673610398398.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=8be29531273672ec0719e6c0dc5fed61","full":"https://images.zeiss.com/metrology/products/software/piweb/piweb_control-chart.ts-1673610398398.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=2d579a066de6339025af2526dfc24178"})
Control charts
Evaluate process data with built-in plots for x̅, S (standard deviation) & R (range).
Capability studies
Perform a wide range of capability studies including Cm, Cmk, Cp, Cpk, Po, Pok etc.
![]({"small":"https://images.zeiss.com/metrology/products/software/piweb/piweb_capability-studies.ts-1673610398094.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=640&s=856a6caf59cd0acb4c43d48e3632cd09","large":"https://images.zeiss.com/metrology/products/software/piweb/piweb_capability-studies.ts-1673610398094.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1280&s=e998d2b2c9b19aa45b6c3387768a7206","medium":"https://images.zeiss.com/metrology/products/software/piweb/piweb_capability-studies.ts-1673610398094.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=832&s=d64a86dd7f200fb80a808442b6112f94","full":"https://images.zeiss.com/metrology/products/software/piweb/piweb_capability-studies.ts-1673610398094.jpg?auto=compress%2Cformat&fm=png&ixlib=java-1.1.11&w=1920&s=40ee1d13544172d8703ac6e917d8e3b5"})
More tools
Create reports that incorporate other useful tools such as box plots, histograms, trend lines & bar charts.
Get started now – with the flexible ZEISS PiWeb solutions
Configure ZEISS PiWeb according to your needs depending on your application and challenges
ZEISS PiWeb small business solution
The network-based on-premise solution for small companies.
Benefits:
- Central database management
- Manual data entry, hand gages & upload from third-party devices
- Access to an extensive standard report library
- Easily expand to an enterprise solution